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Room Temperature Direct Band-Gap Emission from an Unstrained Ge P-I-N LED on Si

T. Arguirov, M. Kittler, M. Oehme, N. Abrosimov, E. Kasper, and J. Schulze. Gettering and Defect Engineering in Semiconductor Technology XIV : GADEST 2011, 178, page 25-30. Durnten, Trans Tech Publications, (2011)
DOI: 10.4028/www.scientific.net/SSP.178-179.25

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Martin Baumann

Martin Schwartz University of Stuttgart

Martin Alvarez University of Stuttgart

Univ. -Prof. Martin Ostermann University of Stuttgart

Dr. Martin Rose University of Stuttgart

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Electroluminescence of GeSn/Ge MQW LEDs on Si substrateB. Schwartz, M. Oehme, K. Kostecki, D. Widmann, M. Gollhofer, R. Koerner, S. Bechler, I. Fischer, T. Wendav, E. Kasper and 2 other author(s). Opt. Lett., 40 (13): 3209--3212 (July 2015)Room Temperature Direct Band Gap Emission from Ge p-i-n Heterojunction PhotodiodesE. Kasper, M. Oehme, T. Arguirov, J. Werner, M. Kittler, and J. Schulze. Advances in OptoElectronics, (2012)Dislocation luminescence in highly doped degenerated germanium at room temperatureT. Arguirov, O. Vyvenko, M. Oehme, J. Schulze, and M. Kittler. physica status solidi c, 10 (1): 56-59 (2013)Room Temperature Direct Band-Gap Emission from an Unstrained Ge P-I-N LED on SiT. Arguirov, M. Kittler, M. Oehme, N. Abrosimov, E. Kasper, and J. Schulze. Gettering and Defect Engineering in Semiconductor Technology XIV : GADEST 2011, 178, page 25-30. Durnten, Trans Tech Publications, (2011)Luminescence of strained Ge on GeSn virtual substrate grown on Si (001)B. Schwartz, M. Oehme, R. Koerner, S. Bechler, J. Schulze, and M. Kittler. Silicon Photonics XII, 10108, page 101080D. SPIE, (2017)Ge and GeSn Light Emitters on SiM. Oehme, M. Gollhofer, K. Kostecki, R. Koerner, S. Bechler, D. Widmann, T. Arguirov, M. Kittler, and J. Schulze. Gettering and Defect Engineering in Semiconductor Technology XVI, volume 242 of Solid State Phenomena, page 353-360. Trans Tech Publications, (2016)Analysis of EL Emitted by LEDs on Si Substrates Containing GeSn/Ge Multi Quantum Wells as Active LayersB. Schwartz, P. Saring, T. Arguirov, M. Oehme, K. Kostecki, E. Kasper, J. Schulze, and M. Kittler. Gettering and Defect Engineering in Semiconductor Technology XVI, 242, page 361-367. Pfaffikon, Trans Tech Publications, (2016)