The Eigenfactor® Project is an academic research project co-founded in January 2007 by Carl Bergstrom and Jevin West (pictured below), and sponsored by the West Lab at the Information School and the Bergstrom Lab in the Department of Biology at the University of Washington.
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J. Dick, A. Elsayed, D. Schwarz, and J. Schulze. 2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO), page 19-23. (May 2019)
L. Gebert, D. Schwarz, A. Elsayed, and J. Schulze. 2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO), page 13-18. (May 2019)
T. Haist, U. Schmid, and W. Osten. VDI BERICHTE, (2007)1 cites: https://scholar.google.com/scholar?cites=10614276875974354744&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, L. He, M. Warber, T. Haist, and W. Osten. Proc. der DGaO, (2007)2 cites: https://scholar.google.com/scholar?cites=2224526662259757506&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Gronle, D. Bui, and W. Osten. tm-Technisches Messen, (2015)4 cites: https://scholar.google.com/scholar?cites=8530019438080874564&as_sdt=2005&sciodt=0,5&hl=en.
H. Tiziani, M. Schönleber, and T. Haist. Optical 3D Measurements, Publisher Gruen, A …, (1997)2 cites: https://scholar.google.com/scholar?cites=17854206010731599739&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. tm Technisches Messen Plattform für Methoden …, (2002)2 cites: https://scholar.google.com/scholar?cites=17178941677927862963&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. TECHNISCHES MESSEN, (2002)1 cites: https://scholar.google.com/scholar?cites=13362241692780377838&as_sdt=2005&sciodt=0,5&hl=en.
S. Dolev, T. Haist, and M. Oltean. Springer, Berlin, (2008)2 cites: https://scholar.google.com/scholar?cites=2579238464927995758&as_sdt=2005&sciodt=0,5&hl=en.
H. Caulfield, S. Dolev, T. Haist, and M. Oltean. Lecture Notes in Comp. Sci, (2008)2 cites: https://scholar.google.com/scholar?cites=5230169121017134821&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and W. Osten. The Journal of Supercomputing, (2012)1 cites: https://scholar.google.com/scholar?cites=8022635775438100007&as_sdt=2005&sciodt=0,5&hl=en.
S. Dong, T. Haist, W. Osten, T. Ruppel, and .... Proc. SPIE, (2012)2 cites: https://scholar.google.com/scholar?cites=11190995107346479570&as_sdt=2005&sciodt=0,5&hl=en.
S. Gharbi, H. Pang, C. Lingel, T. Haist, and W. Osten. Applied optics, (2017)1 cites: https://scholar.google.com/scholar?cites=7687204403978225625&as_sdt=2005&sciodt=0,5&hl=en.
L. Seifert, T. Ruppel, T. Haist, and .... Interferometry XIII …, (2006)2 cites: https://scholar.google.com/scholar?cites=7147880278335580806&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Reicherter, M. Wu, and L. Seifert. Comput. Sci. Eng., (2006)3 cites: https://scholar.google.com/scholar?cites=14566195398217273875&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. Optics communications, (1999)6 cites: https://scholar.google.com/scholar?cites=7686503495750243020&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Schönleber, and H. Tiziani. Applied optics, (1998)3 cites: https://scholar.google.com/scholar?cites=13523355979693248351&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, T. Haist, M. Warber, and S. Osten. Proceedings of SPIE, (2007)3 cites: https://scholar.google.com/scholar?cites=17443734874373782994&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, U. Schmid, and W. Osten. VDI Berichte, (1981)3 cites: https://scholar.google.com/scholar?cites=6001163947811595426&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. Optical Inspection and …, (1997)3 cites: https://scholar.google.com/scholar?cites=4086429519103832408&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, M. Warber, T. Haist, and .... … Measurement Systems for …, (2007)3 cites: https://scholar.google.com/scholar?cites=13122883090839124938&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, W. Osten, M. Reicherter, and .... Optical Information …, (2003)3 cites: https://scholar.google.com/scholar?cites=13914692911788684678&as_sdt=2005&sciodt=0,5&hl=en.
C. Rembe, and T. Haist. US Patent 8,115,933, (2012)5 cites: https://scholar.google.com/scholar?cites=13085958234674355483&as_sdt=2005&sciodt=0,5&hl=en.
M. Warber, T. Haist, M. Hasler, and W. Osten. Optical Engineering, (2012)5 cites: https://scholar.google.com/scholar?cites=11260130449230490731&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and W. Osten. Journal of Micro/Nanolithography, MEMS …, (2015)7 cites: https://scholar.google.com/scholar?cites=16007974591760507561&as_sdt=2005&sciodt=0,5&hl=en.
M. Hasler, J. Stahl, T. Haist, and W. Osten. Optical Engineering, (2015)4 cites: https://scholar.google.com/scholar?cites=2954937903817151273&as_sdt=2005&sciodt=0,5&hl=en.
E. Wagemann, T. Haist, and H. Tiziani. Optics communications, (1998)6 cites: https://scholar.google.com/scholar?cites=18152547233854539301&as_sdt=2005&sciodt=0,5&hl=en.
W. Osten, T. Haist, and K. Korner. Proceedings of International Conference On Laser …, (2003)9 cites: https://scholar.google.com/scholar?cites=1836599854242513742&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, E. Wagemann, and .... Laser Metrology and …, (1999)9 cites: https://scholar.google.com/scholar?cites=3277523645490623696&as_sdt=2005&sciodt=0,5&hl=en.
A. Burla, T. Haist, W. Lyda, and W. Osten. Optical Engineering, (2011)9 cites: https://scholar.google.com/scholar?cites=16941387280344346587&as_sdt=2005&sciodt=0,5&hl=en.
M. Reicherter, T. Haist, S. Zwick, A. Burla, and .... Optical Trapping …, (2005)11 cites: https://scholar.google.com/scholar?cites=5362886375644632840&as_sdt=2005&sciodt=0,5&hl=en.
C. Kohler, T. Haist, and W. Osten. Optical Engineering, (2009)13 cites: https://scholar.google.com/scholar?cites=5258858583107486043&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, C. Schaub, T. Haist, and W. Osten. Optics Express, (2010)11 cites: https://scholar.google.com/scholar?cites=14873270305070020601&as_sdt=2005&sciodt=0,5&hl=en.
M. Warber, S. Maier, T. Haist, and W. Osten. Applied optics, (2010)13 cites: https://scholar.google.com/scholar?cites=17105723800624126736&as_sdt=2005&sciodt=0,5&hl=en.
W. Lyda, A. Burla, T. Haist, M. Gronle, and W. Osten. International Journal of …, (2012)12 cites: https://scholar.google.com/scholar?cites=9954681190140723856&as_sdt=2005&sciodt=0,5&hl=en.
E. Wagemann, T. Haist, M. Schönleber, and H. Tiziani. Optics communications, (1999)15 cites: https://scholar.google.com/scholar?cites=3306664058810748006&as_sdt=2005&sciodt=0,5&hl=en.
H. Tiziani, T. Haist, J. Liesener, and .... Spatial Light …, (2001)15 cites: https://scholar.google.com/scholar?cites=13453178495817267113&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, E. Wagemann, and H. Tiziani. Journal of Optics A: Pure …, (1999)15 cites: https://scholar.google.com/scholar?cites=8162882387938461535&as_sdt=2005&sciodt=0,5&hl=en.
…, M. Warber, S. Zwick, H. van der Kuip, T. Haist, and .... Journal of the European Optical Society, (2009)15 cites: https://scholar.google.com/scholar?cites=3295751589320055504&as_sdt=2005&sciodt=0,5&hl=en.
A. Burla, T. Haist, W. Lyda, and W. Osten. Optical Engineering, (2012)13 cites: https://scholar.google.com/scholar?cites=1065791505102195850&as_sdt=2005&sciodt=0,5&hl=en.
S. Dong, T. Haist, and W. Osten. Applied optics, (2012)16 cites: https://scholar.google.com/scholar?cites=7007654108719796123&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and W. Osten. Journal of Micro/Nanolithography, MEMS …, (2015)15 cites: https://scholar.google.com/scholar?cites=5823958335346115337&as_sdt=2005&sciodt=0,5&hl=en.
M. Reicherter, W. Gorski, T. Haist, and .... Biophotonics Micro-and …, (2004)23 cites: https://scholar.google.com/scholar?cites=11436757648181959689&as_sdt=2005&sciodt=0,5&hl=en.
M. Reicherter, J. Liesener, T. Haist, and .... … on Biomedical Optics, (2003)18 cites: https://scholar.google.com/scholar?cites=10280767393147506409&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Reicherter, M. Wu, and L. Seifert. Computing in Science & …, (2005)29 cites: https://scholar.google.com/scholar?cites=4486626183207143386&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, S. Zwick, M. Warber, and .... Journal of Holography and …, (2006)21 cites: https://scholar.google.com/scholar?cites=3412191072089378493&as_sdt=2005&sciodt=0,5&hl=en.
C. Kohler, T. Haist, X. Schwab, and W. Osten. Optics express, (2008)31 cites: https://scholar.google.com/scholar?cites=4352752689482019660&as_sdt=2005&sciodt=0,5&hl=en.
M. Hasler, T. Haist, and W. Osten. Optics letters, (2012)22 cites: https://scholar.google.com/scholar?cites=4553495401397891673&as_sdt=2005&sciodt=0,5&hl=en.
C. Lingel, T. Haist, and W. Osten. Applied optics, (2013)33 cites: https://scholar.google.com/scholar?cites=4909847424653763293&as_sdt=2005&sciodt=0,5&hl=en.