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Genetic programming applied to automatic algorithm design in multi-scale inspection systems

A. Burla, T. Haist, W. Lyda, and W. Osten. Optical Engineering, (2012)13 cites: https://scholar.google.com/scholar?cites=1065791505102195850&as_sdt=2005&sciodt=0,5&hl=en.

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Tim W{\"{u}}rtele

Tim W{\"{u}}rtele

Kent W. Stewart

Tim W{\"{u}}rtele

Dipl.-Ing. W. Halter University of Stuttgart

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Fusion multimodaler Daten am Beispiel eines Mikrolinsen-ArraysJ. Regin, E. Westkämper, S. Schröder, A. Tünnermann, A. Duparre, M. Ritter, A. Staude, J. Goebbels, A. Kranzmann, P. Krämer and 5 other author(s). tm - Technisches Messen, 75 (5): 346--359 (2008)Definition and Design of an Automated Multiscale Measuring SystemJ. Zimmermann, J. Regin, W. Lyda, T. Wiesendanger, O. Sawodny, E. Westkämper, and W. Osten. euspen International Conference, 2, page 425-430. Zurich, Switzerland, (May 2008)An assistance system for the selection of sensors in multi-scale measurement systemsA. Burla, T. Haist, W. Lyda, and .... Proc. SPIE, (2010)13 cites: https://scholar.google.com/scholar?cites=11729316344759848032&as_sdt=2005&sciodt=0,5&hl=en.4.3.1 Herausforderungen und Lösungsansätze für die fertigungsnahe Qualitätskontrolle mittels optischer 3D-MesstechnikD. Fleische, K. Körner, W. Lyda, M. Gronle, F. Mauch, and W. Osten. (2013)Multisensorisches Messsystem zur dreidimensionalen Inspektion technischer OberflächenA. Keck, M. Böhm, K. Knierim, O. Sawodny, M. Gronle, W. Lyda, and W. Osten. tm - Technisches Messen, 81 (6): 280--288 (2014)Reliability Analysis of Indicator Functions in an Automated Multiscale Measuring SystemA. Burla, W. Lyda, W. Osten, J. Regin, E. Westkämper, J. Zimmermann, and O. Sawodny. (2010)Automated multiscale measurement system for MEMS characterisationW. Lyda, A. Burla, T. Haist, J. Zimmermann, and .... Optical Micro-and …, (2010)14 cites: https://scholar.google.com/scholar?cites=1524075053293164982&as_sdt=2005&sciodt=0,5&hl=en.Chromatic confocal spectral interferometry for technical surface characterizationW. Lyda, D. Fleischle, T. Haist, and .... Optical Inspection and …, (2009)11 cites: https://scholar.google.com/scholar?cites=16198342556063896427&as_sdt=2005&sciodt=0,5&hl=en.Optical metrology for process control: modeling and simulation of sensors for a comparison of different measurement principlesD. Fleischle, W. Lyda, F. Mauch, and W. Osten. Optical Micro- and Nanometrology III, SPIE, (April 2010)Relibility Analysis of Indicator Functions in an Automated Multiscale Measuring SystemA. Burla, J. Regin, W. Lyda, J. Zimmerman, W. Osten, E. Westkämper, and O. Sawodny. Opto, Nürnberg, Germany, (May 2009)