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Disambiguation of "Grasser, Tibor"

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Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications.

, , , , , , , , , , , , , , , and . ICICDT, page 1-4. IEEE, (2012)

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Tibor Döpper University of Stuttgart

 

Other publications of authors with the same name

Mixture of negative bias temperature instability and hot-carrier driven threshold voltage degradation of 130 nm technology p-channel transistors., , , , and . Microelectronics Reliability, 54 (9-10): 2310-2314 (2014)Stochastic charge trapping in oxides: From random telegraph noise to bias temperature instabilities.. Microelectronics Reliability, 52 (1): 39-70 (2012)Reliability of next-generation field-effect transistors with transition metal dichalcogenides., , , , , , and . IRPS, page 5. IEEE, (2018)ViennaCL - Linear Algebra Library for Multi- and Many-Core Architectures., , , , , , , and . SIAM J. Scientific Computing, (2016)Extraction of material parameters based on inverse modeling of three-dimensional interconnect fusing structures., , , , , and . Microelectronics Journal, 35 (10): 805-810 (2004)Improving SiC lateral DMOSFET reliability under high field stress., , , , and . Microelectronics Reliability, 43 (9-11): 1889-1894 (2003)Comparison of deposition models for a TEOS LPCVD process., , , , and . Microelectronics Reliability, 47 (4-5): 623-625 (2007)Origins and implications of increased channel hot carrier variability in nFinFETs., , , , , , , , , and 11 other author(s). IRPS, page 3. IEEE, (2015)Impact of gate poly doping and oxide thickness on the N- and PBTI in MOSFETs., , , and . Microelectronics Reliability, 51 (9-11): 1530-1534 (2011)Discretization of Macroscopic Transport Equations on Non-Cartesian Coordinate Systems., and . IEEE Trans. on CAD of Integrated Circuits and Systems, 26 (8): 1408-1416 (2007)