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Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications.

J. Franco, B. Kaczer, J. Mitard, M. Toledano-Luque, F. Crupi, G. Eneman, P. Rousse, T. Grasser, M. Cho, T. Kauerauf, L. Witters, G. Hellings, L. Ragnarsson, N. Horiguchi, M. Heyns, and G. Groeseneken. ICICDT, page 1-4. IEEE, (2012)

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Sequential 3D: Key integration challenges and opportunities for advanced semiconductor scaling.A. Vandooren, L. Witters, J. Franco, A. Mallik, B. Parvais, Z. Wu, A. Walke, V. Deshpande, E. Rosseel, A. Hikavyy and 15 other author(s). ICICDT, page 145-148. IEEE, (2018)Buried Silicon-Germanium pMOSFETs: Experimental Analysis in VLSI Logic Circuits Under Aggressive Voltage Scaling.F. Crupi, M. Alioto, J. Franco, P. Magnone, B. Kaczer, G. Groeseneken, J. Mitard, L. Witters, and T. Hoffmann. IEEE Trans. VLSI Syst., 20 (8): 1487-1495 (2012)Scalability comparison between raised- and embedded-SiGe source/drain structures for Si0.55Ge0.45 implant free quantum well pFET.S. Yamaguchi, L. Witters, J. Mitard, G. Eneman, G. Hellings, A. Hikavyy, R. Loo, and N. Horiguchi. Microelectronics Reliability, (2018)Beyond-Si materials and devices for more Moore and more than Moore applications.N. Collaert, A. Alian, H. Arimura, G. Boccardi, G. Eneman, J. Franco, T. Ivanov, D. Lin, J. Mitard, S. Ramesh and 16 other author(s). ICICDT, page 1-5. IEEE, (2016)Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications.J. Franco, B. Kaczer, J. Mitard, M. Toledano-Luque, F. Crupi, G. Eneman, P. Rousse, T. Grasser, M. Cho, T. Kauerauf and 6 other author(s). ICICDT, page 1-4. IEEE, (2012)Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scaling.F. Crupi, M. Alioto, J. Franco, P. Magnone, B. Kaczer, G. Groeseneken, J. Mitard, L. Witters, and T. Hoffmann. ISCAS, page 2249-2252. IEEE, (2011)

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Disambiguation of "Witters, Liesbeth"

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Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications.

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Disambiguation of "Witters, Liesbeth"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications.

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Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications.