%0 Conference Paper %1 conf/icicdt/FrancoKMTCERGCK12 %A Franco, Jacopo %A Kaczer, Ben %A Mitard, Jérôme %A Toledano-Luque, Maria %A Crupi, Felice %A Eneman, Geert %A Rousse, Ph. J. %A Grasser, Tibor %A Cho, M. %A Kauerauf, Thomas %A Witters, Liesbeth %A Hellings, Geert %A Ragnarsson, L.-Å. %A Horiguchi, Naoto %A Heyns, Marc M. %A Groeseneken, Guido %B ICICDT %D 2012 %I IEEE %K dblp %P 1-4 %T Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications. %U http://dblp.uni-trier.de/db/conf/icicdt/icicdt2012.html#FrancoKMTCERGCK12 %@ 978-1-4673-0146-6

@inproceedings{conf/icicdt/FrancoKMTCERGCK12, added-at = {2016-05-27T00:00:00.000+0200}, author = {Franco, Jacopo and Kaczer, Ben and Mitard, Jérôme and Toledano-Luque, Maria and Crupi, Felice and Eneman, Geert and Rousse, Ph. J. and Grasser, Tibor and Cho, M. and Kauerauf, Thomas and Witters, Liesbeth and Hellings, Geert and Ragnarsson, L.-Å. and Horiguchi, Naoto and Heyns, Marc M. and Groeseneken, Guido}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/280cef31828826bdd6843daca39bba8e4/dblp}, booktitle = {ICICDT}, crossref = {conf/icicdt/2012}, ee = {http://dx.doi.org/10.1109/ICICDT.2012.6232839}, interhash = {86b67bb4b4c0b50764264cc8bfe5a1b7}, intrahash = {80cef31828826bdd6843daca39bba8e4}, isbn = {978-1-4673-0146-6}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2016-05-28T09:35:28.000+0200}, title = {Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications.}, url = {http://dblp.uni-trier.de/db/conf/icicdt/icicdt2012.html#FrancoKMTCERGCK12}, year = 2012 }