%0 Journal Article %1 journals/mr/Grasser12 %A Grasser, Tibor %D 2012 %J Microelectronics Reliability %K dblp %N 1 %P 39-70 %T Stochastic charge trapping in oxides: From random telegraph noise to bias temperature instabilities. %U http://dblp.uni-trier.de/db/journals/mr/mr52.html#Grasser12 %V 52

@article{journals/mr/Grasser12, added-at = {2012-01-16T00:00:00.000+0100}, author = {Grasser, Tibor}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/225dd6ef0c5d06853e793bdfd8856e1e3/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2011.09.002}, interhash = {6d4a127acdb3e8bc25eb346d3fefd065}, intrahash = {25dd6ef0c5d06853e793bdfd8856e1e3}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 1, pages = {39-70}, timestamp = {2016-02-02T02:02:14.000+0100}, title = {Stochastic charge trapping in oxides: From random telegraph noise to bias temperature instabilities.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#Grasser12}, volume = 52, year = 2012 }