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%0 Conference Paper
%1 conf/irps/IllarionovMWKFM18
%A Illarionov, Yury Yu.
%A Molina-Mendoza, A. J.
%A Waltl, Michael
%A Knobloch, Theresia
%A Furchi, Marco M.
%A Mueller, T.
%A Grasser, Tibor
%B IRPS
%D 2018
%I IEEE
%K dblp
%P 5
%T Reliability of next-generation field-effect transistors with transition metal dichalcogenides.
%U http://dblp.uni-trier.de/db/conf/irps/irps2018.html#IllarionovMWKFM18
%@ 978-1-5386-5479-8
@inproceedings{conf/irps/IllarionovMWKFM18,
added-at = {2019-01-22T00:00:00.000+0100},
author = {Illarionov, Yury Yu. and Molina-Mendoza, A. J. and Waltl, Michael and Knobloch, Theresia and Furchi, Marco M. and Mueller, T. and Grasser, Tibor},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/24f2bd3a55f7a435da01cee4716708491/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2018},
ee = {https://doi.org/10.1109/IRPS.2018.8353605},
interhash = {7ad485985285be971be8170ab78b1c08},
intrahash = {4f2bd3a55f7a435da01cee4716708491},
isbn = {978-1-5386-5479-8},
keywords = {dblp},
pages = 5,
publisher = {IEEE},
timestamp = {2019-09-27T13:33:22.000+0200},
title = {Reliability of next-generation field-effect transistors with transition metal dichalcogenides.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2018.html#IllarionovMWKFM18},
year = 2018
}
