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Disambiguation of "Wen, Xiaoqing"

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Power-aware test generation with guaranteed launch safety for at-speed scan testing.

, , , , , , , and . VTS, page 166-171. IEEE Computer Society, (2011)

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Dr. -Ing. Christoph Wenzel University of Stuttgart

Florian Wendt University of Stuttgart

Dr. rer. nat. Tim Wendlandt University of Stuttgart

Ingeborg Wenger University of Stuttgart

Florian Wenz University of Stuttgart

 

Other publications of authors with the same name

Fault Diagnosis of Physical Defects Using Unknown Behavior Model., , , and . J. Comput. Sci. Technol., 20 (2): 187-194 (2005)On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST., , , , , , and . Asian Test Symposium, page 19-24. IEEE Computer Society, (2013)Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling., , , , , , , , , and 1 other author(s). Asian Test Symposium, page 90-95. IEEE Computer Society, (2011)Towards the next generation of low-power test technologies.. ASICON, page 232-235. IEEE, (2011)VLSI testing and test power.. IGCC, page 1-6. IEEE Computer Society, (2011)Formal Test Point Insertion for Region-based Low-Capture-Power Compact At-Speed Scan Test., , , , and . ATS, page 173-178. IEEE Computer Society, (2016)A Flexible Power Control Method for Right Power Testing of Scan-Based Logic BIST., , , , and . ATS, page 203-208. IEEE Computer Society, (2016)Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing., , , , , , and . J. Electronic Testing, 24 (4): 379-391 (2008)Using Launch-on-Capture for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains., , , , , , , , , and 2 other author(s). IEEE Trans. on CAD of Integrated Circuits and Systems, 30 (3): 455-463 (2011)Test Pattern Modification for Average IR-Drop Reduction., , , , and . IEEE Trans. VLSI Syst., 24 (1): 38-49 (2016)