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Power-aware test generation with guaranteed launch safety for at-speed scan testing.

, , , , , , , and . VTS, page 166-171. IEEE Computer Society, (2011)

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SAT-based capture-power reduction for at-speed broadcast-scan-based test compression architectures., , , , , , and . ISLPED, page 33-38. IEEE/ACM, (2011)Power-aware test generation with guaranteed launch safety for at-speed scan testing., , , , , , , and . VTS, page 166-171. IEEE Computer Society, (2011)On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression., , , , , and . VLSI Design, page 279-284. IEEE Computer Society, (2013)A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits., , , , , , , and . VTS, page 197-202. IEEE Computer Society, (2012)CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing., , , , , , , and . Asian Test Symposium, page 99-104. IEEE Computer Society, (2009)Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling., , , , , , , , , and 1 other author(s). Asian Test Symposium, page 90-95. IEEE Computer Society, (2011)