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Disambiguation of "Jr., John M. Carulli"

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Adapting to adaptive testing.

, , , , , , , , and . DATE, page 556-561. IEEE, (2010)

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John Nixon University of Stuttgart

Isaac Henderson Johnson Jeyakumar University of Stuttgart

David John Cross University of Stuttgart

M. Nudischer

M. Kratzer

 

Other publications of authors with the same name

Predicting die-level process variations from wafer test data for analog devices: A feasibility study., , , , , and . LATW, page 1-6. IEEE Computer Society, (2013)Parametric counterfeit IC detection via Support Vector Machines., , and . DFT, page 7-12. IEEE Computer Society, (2012)IC laser trimming speed-up through wafer-level spatial correlation modeling., , , , , , and . ITC, page 1-7. IEEE Computer Society, (2014)Variation and failure characterization through pattern classification of test data from multiple test stages., , , , , , and . ITC, page 1-10. IEEE, (2016)Spatial correlation modeling for probe test cost reduction in RF devices., , , and . ICCAD, page 23-29. ACM, (2012)Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests., , , and . DATE, page 553-558. EDA Consortium San Jose, CA, USA / ACM DL, (2013)On combining alternate test with spatial correlation modeling in analog/RF ICs., , , and . ETS, page 1-6. IEEE Computer Society, (2013)The Impact of Multiple Failure Modes on Estimating Product Field Reliability., and . IEEE Design & Test of Computers, 23 (2): 118-126 (2006)Quality improvement and cost reduction using statistical outlier methods., , , and . ICCD, page 64-69. IEEE Computer Society, (2009)A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits., , , , , and . DATE, page 1042-1047. ACM, (2015)