PUMA

academical publication management
collect, organize, and share publications

( en | de )

 

Disambiguation of "Nahar, Amit"

Author of the publication

copydeleteadd this publication to your clipboard
IC laser trimming speed-up through wafer-level spatial correlation modeling.

, , , , , , and . ITC, page 1-7. IEEE Computer Society, (2014)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

No persons found for author name Nahar, Amit
add a person with the name Nahar, Amit
 

Other publications of authors with the same name

Yield Forecasting in Fab-to-Fab Production Migration Based on Bayesian Model Fusion., , , , , and . ICCAD, page 9-14. IEEE, (2015)Statistical outlier screening as a test solution health monitor., , , and . ITC, page 1-10. IEEE, (2016)Quality improvement and cost reduction using statistical outlier methods., , , and . ICCD, page 64-69. IEEE Computer Society, (2009)Yield prognosis for fab-to-fab product migration., , , , , , and . VTS, page 1-6. IEEE Computer Society, (2015)Harnessing process variations for optimizing wafer-level probe-test flow., , , , , and . ITC, page 1-8. IEEE, (2016)What we know after twelve years developing and deploying test data analytics solutions., , and . ITC, page 1-8. IEEE, (2016)A machine learning approach to fab-of-origin attestation., , , , , and . ICCAD, page 92. ACM, (2016)Multidimensional Test Escape Rate Modeling., , , , and . IEEE Design & Test of Computers, 26 (5): 74-82 (2009)Statistics in Semiconductor Test: Going beyond Yield., , and . IEEE Design & Test of Computers, 26 (5): 64-73 (2009)Adapting to adaptive testing., , , , , , , , and . DATE, page 556-561. IEEE, (2010)