PUMA

academical publication management
collect, organize, and share publications

( en | de )

 

Disambiguation of "Butler, Kenneth M."

Author of the publication

copydeleteadd this publication to your clipboard
Adapting to adaptive testing.

, , , , , , , , and . DATE, page 556-561. IEEE, (2010)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

M. Nudischer

M. Kratzer

M. Liewald

M. Fittingho

M. Christmann

 

Other publications of authors with the same name

The stuck-at fault: it ain't over 'til it's over.. ITC, page 1165. (1997)An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing., , , , and . VTS, page 459. IEEE Computer Society, (1997)Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers., , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 26 (5): 896-906 (2007)Fast functional evaluation of candidate OBDD variable orderings., , , and . EURO-DAC, page 4-10. EEE Computer Society, (1991)An empirical study on the effects of test type ordering on overall test efficiency., and . ITC, page 408-416. IEEE Computer Society, (2000)Expediting ramp-to-volume production., , , , , , and . ITC, page 103-112. IEEE Computer Society, (1999)A case study on the implementation of the Illinois Scan Architecture., , and . ITC, page 538-547. IEEE Computer Society, (2001)An analysis of power reduction techniques in scan testing., , and . ITC, page 670-677. IEEE Computer Society, (2001)Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges ., , , , , , , and . ITC, page 1120-1129. IEEE Computer Society, (2002)Estimating the Economic Benefits of DFT.. IEEE Design & Test of Computers, 16 (1): 71-79 (1999)