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Safety features of SoCs: How can they be re-used?. DDECS, page 2. IEEE Computer Society, (2010)An I-IP based approach for the monitoring of NBTI effects in SoCs., , , , , , and . IOLTS, page 15-20. IEEE Computer Society, (2009)A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques., , , , , , and . J. Electronic Testing, 20 (1): 79-87 (2004)Cumulative embedded memory failure bitmap display & analysis., , , , , , , and . DDECS, page 255-260. IEEE Computer Society, (2010)The Yield of Test Outsourcing.. ITC, page 1215. IEEE Computer Society, (2002)High Accuracy Stimulus Generation for A/D Converter BIST., , , and . ITC, page 1031-1039. IEEE Computer Society, (2002)An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs., , , , and . European Test Symposium, page 140-145. IEEE Computer Society, (2008)On the Automation of the Test Flow of Complex SoCs., , , , , and . VTS, page 166-171. IEEE Computer Society, (2006)Evaluating Alpha-induced soft errors in embedded microprocessors., , , , , , and . IOLTS, page 69-74. IEEE Computer Society, (2009)Adapting to adaptive testing., , , , , , , , and . DATE, page 556-561. IEEE, (2010)