%0 Conference Paper %1 conf/ets/AppelloBCGG08 %A Appello, Davide %A Bernardi, Paolo %A Cagliesi, R. %A Giancarlini, M. %A Grosso, Michelangelo %B European Test Symposium %D 2008 %I IEEE Computer Society %K dblp %P 140-145 %T An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs. %U http://dblp.uni-trier.de/db/conf/ets/ets2008.html#AppelloBCGG08 %@ 978-0-7695-3150-2

@inproceedings{conf/ets/AppelloBCGG08, added-at = {2015-08-18T00:00:00.000+0200}, author = {Appello, Davide and Bernardi, Paolo and Cagliesi, R. and Giancarlini, M. and Grosso, Michelangelo}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2cb03510b8932749315cd5eaf7a483618/dblp}, booktitle = {European Test Symposium}, crossref = {conf/ets/2008}, ee = {http://doi.ieeecomputersociety.org/10.1109/ETS.2008.27}, interhash = {c4739a9d1e70f8316733ce50ff11627d}, intrahash = {cb03510b8932749315cd5eaf7a483618}, isbn = {978-0-7695-3150-2}, keywords = {dblp}, pages = {140-145}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T15:20:08.000+0100}, title = {An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2008.html#AppelloBCGG08}, year = 2008 }