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Disambiguation of "Appello, Davide"

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Cumulative embedded memory failure bitmap display & analysis.

, , , , , , , and . DDECS, page 255-260. IEEE Computer Society, (2010)

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Davide Padeletti University of Stuttgart

PD Dr. rer. nat. Davide Cesare Veniani University of Stuttgart

 

Other publications of authors with the same name

Safety features of SoCs: How can they be re-used?. DDECS, page 2. IEEE Computer Society, (2010)An I-IP based approach for the monitoring of NBTI effects in SoCs., , , , , , and . IOLTS, page 15-20. IEEE Computer Society, (2009)A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques., , , , , , and . J. Electronic Testing, 20 (1): 79-87 (2004)Cumulative embedded memory failure bitmap display & analysis., , , , , , , and . DDECS, page 255-260. IEEE Computer Society, (2010)Adapting to adaptive testing., , , , , , , , and . DATE, page 556-561. IEEE, (2010)Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test., , , , , , , , , and . DDECS, page 1-6. IEEE, (2019)Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores., , , , , , and . ITC, page 379-385. IEEE Computer Society, (2003)Optimized embedded memory diagnosis., , , , , , , , and . DDECS, page 347-352. IEEE Computer Society, (2011)A P1500 Compliant BIST-Based Approach to Embedded RAM Diagnosis., , , , and . Asian Test Symposium, page 97-102. IEEE Computer Society, (2001)The Yield of Test Outsourcing.. ITC, page 1215. IEEE Computer Society, (2002)