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Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests.

, , , and . DATE, page 553-558. EDA Consortium San Jose, CA, USA / ACM DL, (2013)

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DFTT: Design for Trojan Test., , and . ICECS, page 1168-1171. IEEE, (2010)Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction., , , and . European Test Symposium, page 35-40. IEEE Computer Society, (2008)Spatial estimation of wafer measurement parameters using Gaussian process models., , , and . ITC, page 1-8. IEEE Computer Society, (2012)Integrated optimization of semiconductor manufacturing: A machine learning approach., and . ITC, page 1-10. IEEE Computer Society, (2012)Applying the Model-View-Controller Paradigm to Adaptive Test., and . IEEE Design & Test of Computers, 29 (1): 28-35 (2012)Correlating inline data with final test outcomes in analog/RF devices., , and . DATE, page 812-817. IEEE, (2011)Silicon Demonstration of Statistical Post-Production Tuning., , , , and . ISVLSI, page 628-633. IEEE Computer Society, (2015)Improving Analog and RF Device Yield through Performance Calibration., , , and . IEEE Design & Test of Computers, 28 (3): 64-75 (2011)Spatial correlation modeling for probe test cost reduction in RF devices., , , and . ICCAD, page 23-29. ACM, (2012)Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models., , , , and . IEEE Design & Test, 32 (1): 53-60 (2015)