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%0 Conference Paper
%1 conf/latw/DevarakondMNCBC13
%A Devarakond, Shyam Kumar
%A McCoy, J.
%A Nahar, Amit
%A Jr., John M. Carulli
%A Bhattacharya, S.
%A Chatterjee, Abhijit
%B LATW
%D 2013
%I IEEE Computer Society
%K dblp
%P 1-6
%T Predicting die-level process variations from wafer test data for analog devices: A feasibility study.
%U http://dblp.uni-trier.de/db/conf/latw/latw2013.html#DevarakondMNCBC13
%@ 978-1-4799-0597-3
@inproceedings{conf/latw/DevarakondMNCBC13,
added-at = {2015-08-26T00:00:00.000+0200},
author = {Devarakond, Shyam Kumar and McCoy, J. and Nahar, Amit and Jr., John M. Carulli and Bhattacharya, S. and Chatterjee, Abhijit},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2eb7a518f56ae21f2efdb0e51433d95a6/dblp},
booktitle = {LATW},
crossref = {conf/latw/2013},
ee = {http://doi.ieeecomputersociety.org/10.1109/LATW.2013.6562658},
interhash = {97e6a20b07f437c09c91189e26537347},
intrahash = {eb7a518f56ae21f2efdb0e51433d95a6},
isbn = {978-1-4799-0597-3},
keywords = {dblp},
pages = {1-6},
publisher = {IEEE Computer Society},
timestamp = {2016-02-02T11:13:15.000+0100},
title = {Predicting die-level process variations from wafer test data for analog devices: A feasibility study.},
url = {http://dblp.uni-trier.de/db/conf/latw/latw2013.html#DevarakondMNCBC13},
year = 2013
}