%0 Conference Paper %1 conf/ets/HuangKCM13 %A Huang, Ke %A Kupp, Nathan %A Jr., John M. Carulli %A Makris, Yiorgos %B ETS %D 2013 %I IEEE Computer Society %K dblp %P 1-6 %T On combining alternate test with spatial correlation modeling in analog/RF ICs. %U http://dblp.uni-trier.de/db/conf/ets/ets2013.html#HuangKCM13 %@ 978-1-4673-6376-1

@inproceedings{conf/ets/HuangKCM13, added-at = {2015-08-20T00:00:00.000+0200}, author = {Huang, Ke and Kupp, Nathan and Jr., John M. Carulli and Makris, Yiorgos}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2c452c304aec61d806db35ad73915a0d8/dblp}, booktitle = {ETS}, crossref = {conf/ets/2013}, ee = {http://doi.ieeecomputersociety.org/10.1109/ETS.2013.6569358}, interhash = {f27288112335a42a210c2929a8f52d70}, intrahash = {c452c304aec61d806db35ad73915a0d8}, isbn = {978-1-4673-6376-1}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T15:20:09.000+0100}, title = {On combining alternate test with spatial correlation modeling in analog/RF ICs.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2013.html#HuangKCM13}, year = 2013 }