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Disambiguation of "Linten, Dimitri"

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New methodology for modelling MOL TDDB coping with variability.

, , , , , and . IRPS, page 3. IEEE, (2018)

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Dimitri Evcenko University of Stuttgart

Dimitri Graf University of Stuttgart

Dr. rer. pol. Dimitri Petrik University of Stuttgart

Hans Dimitri Papdo Tchasse University of Stuttgart

 

Other publications of authors with the same name

ESD protection diodes in optical interposer technology., , , , , , and . ICICDT, page 1-4. IEEE, (2015)ESD diodes with Si/SiGe superlattice I/O finFET architecture in a vertically stacked horizontal nanowire technology., , , , and . ESSDERC, page 194-197. IEEE, (2018)Gate-Stack Engineered NBTI Improvements in Highvoltage Logic-For-Memory High-ĸ/Metal Gate Devices., , , , , , , , , and 6 other author(s). IRPS, page 1-8. IEEE, (2019)Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown., , , , , , , , , and 1 other author(s). IRPS, page 5-1. IEEE, (2018)Self-heating-aware CMOS reliability characterization using degradation maps., , , , , , , and . IRPS, page 2. IEEE, (2018)Impact of slow and fast oxide traps on In0.53Ga0.47As device operation studied using CET maps., , , , , , and . IRPS, page 5. IEEE, (2018)Processing active devices on Si interposer and impact on cost., , , , , , , , , and . 3DIC, page TS11.2.1-TS11.2.4. IEEE, (2015)RF ESD protection strategies - the design and performance trade-off challenges., , , , , , , , , and 5 other author(s). CICC, page 489-496. IEEE, (2005)Extended Subspace Identification of Improper Linear Systems., , , and . DATE, page 454-459. IEEE Computer Society, (2004)A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability., , , , , , , , , and 4 other author(s). Microelectronics Reliability, (2018)