Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Self-heating-aware CMOS reliability characterization using degradation maps.

E. Bury, A. Chasin, B. Kaczer, K. Chuang, J. Franco, M. Simicic, P. Weckx, and D. Linten. IRPS, page 2. IEEE, (2018)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Adrian Schlottke University of Stuttgart

Adrian Barwasser University of Stuttgart

Adrian Humboldt University of Stuttgart

A ProTide of AZT Shows Activity Against Human PapillomavirusesT. Gniech, A. Humboldt, K. Keith, S. James, and C. Richert. ChemMedChem, 19 (8): e202300661 (2024)

Adrian Eitle University of Stuttgart

PD Dr. -Ing. Adrian Pocanschi University of Stuttgart

Other publications of authors with the same name

Bidirectional communication in an HF hybrid organic/solution-processed metal-oxide RFID tag.K. Myny, M. Rockele, A. Chasin, D. Pham, J. Steiger, S. Botnaras, D. Weber, B. Herold, J. Ficker, B. van der Putten and 4 other author(s). ISSCC, page 312-314. IEEE, (2012)Self-heating-aware CMOS reliability characterization using degradation maps.E. Bury, A. Chasin, B. Kaczer, K. Chuang, J. Franco, M. Simicic, P. Weckx, and D. Linten. IRPS, page 2. IEEE, (2018)Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random Dopants.A. Makarov, D. Linten, S. Tyaginov, B. Kaczer, P. Roussel, A. Chasin, M. Vandemaele, G. Hellings, A. El-Sayed, M. Jech and 1 other author(s). ESSDERC, page 262-265. IEEE, (2019)A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability.B. Kaczer, J. Franco, P. Weckx, P. Roussel, V. Putcha, E. Bury, M. Simicic, A. Chasin, D. Linten, B. Parvais and 4 other author(s). Microelectronics Reliability, (2018)Array-Based Statistical Characterization of CMOS Degradation Modes and Modeling of the Time-Dependent Variability Induced by Different Stress Patterns in the VG, VD bias space.E. Bury, A. Chasin, M. Vandemaele, S. Beek, J. Franco, B. Kaczer, and D. Linten. IRPS, page 1-6. IEEE, (2019)Role of Defects in the Reliability of HfO2/Si-Based Spacer Dielectric Stacks for Local Interconnects.C. Wu, A. Chasin, A. Padovani, A. Lesniewska, S. Demuynck, and K. Croes. IRPS, page 1-6. IEEE, (2019)Full (Vg, Vd) Bias Space Modeling of Hot-Carrier Degradation in Nanowire FETs.M. Vandemaele, B. Kaczer, S. Tyaginov, Z. Stanojevic, A. Makarov, A. Chasin, E. Bury, H. Mertens, D. Linten, and G. Groeseneken. IRPS, page 1-7. IEEE, (2019)Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs.A. Makarov, B. Kaczer, P. Roussel, A. Chasin, A. Grill, M. Vandemaele, G. Hellings, A. El-Sayed, T. Grasser, D. Linten and 1 other author(s). IRPS, page 1-7. IEEE, (2019)Hot electron and hot hole induced degradation of SiGe p-FinFETs studied by degradation maps in the entire bias space.J. Franco, B. Kaczer, A. Chasin, E. Bury, and D. Linten. IRPS, page 5. IEEE, (2018)Impact of etch stop layer on negative bias illumination stress of amorphous Indium Gallium Zinc Oxide transistors.A. Bhoolokam, M. Nag, A. Chasin, S. Steudel, J. Genoe, G. Gelinck, G. Groeseneken, and P. Heremans. ESSDERC, page 302-304. IEEE, (2014)

PUMA

Disambiguation of "Chasin, Adrian"

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Self-heating-aware CMOS reliability characterization using degradation maps.

Please choose a person to relate this publication to

Adrian Schlottke University of Stuttgart

Adrian Barwasser University of Stuttgart

Adrian Humboldt University of Stuttgart

Adrian Eitle University of Stuttgart

PD Dr. -Ing. Adrian Pocanschi University of Stuttgart

Other publications of authors with the same name

Disambiguation

PUMA

Disambiguation of "Chasin, Adrian"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Self-heating-aware CMOS reliability characterization using degradation maps.

Please choose a person to relate this publication to

Adrian Schlottke University of Stuttgart

Adrian Barwasser University of Stuttgart

Adrian Humboldt University of Stuttgart

Adrian Eitle University of Stuttgart

PD Dr. -Ing. Adrian Pocanschi University of Stuttgart

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Self-heating-aware CMOS reliability characterization using degradation maps.