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RF ESD protection strategies - the design and performance trade-off challenges.

P. Jansen, S. Thijs, D. Linten, M. Natarajan, V. Vassilev, M. Liu, A. Concannon, D. Trémouilles, T. Nakaie, M. Sawada, V. Vashchenko, M. ter Beek, T. Hasebe, S. Decoutere, and G. Groeseneken. CICC, page 489-496. IEEE, (2005)

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Hon. -Prof. Dr. Martin Jansen University of Stuttgart

Jun. -Prof. Dr. Philippe Grönquist University of Stuttgart

Other publications of authors with the same name

Session 20 - Manufacturing beyond moore's law.P. Jansen, and R. Venkatraman. CICC, page 1. IEEE, (2015)Lithography Options for the 32 nm Half Pitch Node and Beyond.K. Ronse, P. Jansen, R. Gronheid, E. Hendrickx, M. Maenhoudt, V. Wiaux, M. Goethals, R. Jonckheere, and G. Vandenberghe. IEEE Trans. on Circuits and Systems, 56-I (8): 1884-1891 (2009)AlGaAs/GaAs: High electron mobility transistor simulations with PRISM.P. Jansen, N. Maene, W. Raedt, S. Naten, D. Stubbe, W. Schoenmaker, M. Rossum, and K. Meyer. European Transactions on Telecommunications, 1 (4): 433-437 (1990)RF ESD protection strategies - the design and performance trade-off challenges.P. Jansen, S. Thijs, D. Linten, M. Natarajan, V. Vassilev, M. Liu, A. Concannon, D. Trémouilles, T. Nakaie, M. Sawada and 5 other author(s). CICC, page 489-496. IEEE, (2005)Lithography options for the 32nm half pitch node and beyond.K. Ronse, P. Jansen, R. Gronheid, E. Hendrickx, M. Maenhoudt, M. Goethals, and G. Vandenberghe. CICC, page 371-378. IEEE, (2008)ESD circuit model based protection network optimisation for extended-voltage NMOS drivers.V. Vassilev, V. Vashchenko, P. Jansen, G. Groeseneken, and M. ter Beek. Microelectronics Reliability, 45 (9-11): 1430-1435 (2005)Inductor-based ESD protection under CDM-like ESD stress conditions for RF applications.S. Thijs, M. Okushima, J. Borremans, P. Jansen, D. Linten, M. Scholz, P. Wambacq, and G. Groeseneken. CICC, page 49-52. IEEE, (2008)CMOS scaling and three-dimensional silicon integration.P. Jansen, and L. Starr. CICC, page 652-653. IEEE, (2005)Process integration and manufacturing issues.P. Jansen, and D. Sunderland. CICC, IEEE, (2009)Session 6 - Advanced SoC/SiP integration & co-design.R. Liu, and P. Jansen. CICC, IEEE, (2008)

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Disambiguation of "Jansen, Philippe"

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RF ESD protection strategies - the design and performance trade-off challenges.

Please choose a person to relate this publication to

Hon. -Prof. Dr. Martin Jansen University of Stuttgart

Jun. -Prof. Dr. Philippe Grönquist University of Stuttgart

Other publications of authors with the same name

Disambiguation

PUMA

Disambiguation of "Jansen, Philippe"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML RF ESD protection strategies - the design and performance trade-off challenges.

Please choose a person to relate this publication to

Hon. -Prof. Dr. Martin Jansen University of Stuttgart

Jun. -Prof. Dr. Philippe Grönquist University of Stuttgart

Other publications of authors with the same name

Disambiguation

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URL
DOI
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RF ESD protection strategies - the design and performance trade-off challenges.