Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Scalability Problems of Digital Circuit Evolution: Evolvability and Efficient Designs., and . Evolvable Hardware, page 55-64. IEEE Computer Society, (2000)Transient voltage overshoot in TLP testing - Real or artifact?, , , , , and . Microelectronics Reliability, 47 (7): 1016-1024 (2007)Fitness landscapes and search in the evolutionary design of digital circuits.. Edinburgh Napier University, UK, (2000)British Library, EThOS.The Evolution of Computation in Co-evolving Demes of Non-uniform Cellular Automata for Global Synchronisation., , and . ECAL, volume 1674 of Lecture Notes in Computer Science, page 159-169. Springer, (1999)Principles in the Evolutionary Design of Digital Circuits - Part II., , and . Genetic Programming and Evolvable Machines, 1 (3): 259-288 (2000)Principles in the Evolutionary Design of Digital Circuits - Part I., , and . Genetic Programming and Evolvable Machines, 1 (1/2): 7-35 (2000)Embedding Landscape Neutrality to Build a Bridge from the Conventional to a More Efficient Three-bit Multiplier Circuit., and . GECCO, page 539-. Morgan Kaufmann, (2000)The Advantages of Landscape Neutrality in Digital Circuit Evolution., and . ICES, volume 1801 of Lecture Notes in Computer Science, page 252-263. Springer, (2000)Editorial ESD reliability special section., and . Microelectronics Reliability, 49 (12): 1405-1406 (2009)Significance of the failure criterion on transmission line pulse testing., , , , and . Microelectronics Reliability, 42 (6): 901-907 (2002)