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Disambiguation of "Trémouilles, David"

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Transient voltage overshoot in TLP testing - Real or artifact?

, , , , , and . Microelectronics Reliability, 47 (7): 1016-1024 (2007)

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Dr. Marie Davidova University of Stuttgart

David Inkermann

David Briesenick University of Stuttgart

David Gudnason University of Stuttgart

David Stieler University of Stuttgart

 

Other publications of authors with the same name

Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation., , , , and . Microelectronics Reliability, 53 (2): 221-228 (2013)Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation., , , , , , and . Microelectronics Reliability, 41 (9-10): 1539-1544 (2001)RF ESD protection strategies - the design and performance trade-off challenges., , , , , , , , , and 5 other author(s). CICC, page 489-496. IEEE, (2005)Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications., , , , , , , , and . Microelectronics Reliability, 44 (9-11): 1781-1786 (2004)A plug-and-play wideband RF circuit ESD protection methodology: T-diodes., , , , , , , , , and . Microelectronics Reliability, 49 (12): 1440-1446 (2009)Accelerated lifetime test of RF-MEMS switches under ESD stress., , , , , , , , and . Microelectronics Reliability, 49 (9-11): 1256-1259 (2009)TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology., , , , , , and . Microelectronics Reliability, 43 (1): 71-79 (2003)Failure analysis of ESD-stressed SiC MESFET., , , , , and . Microelectronics Reliability, 55 (9-10): 1542-1548 (2015)Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure., , , , , , , , and . Microelectronics Reliability, 45 (9-11): 1415-1420 (2005)A new electro-optical transmission-line measurement-method revealing a possible contribution of source and drain contact resistances to GaN HEMT dynamic on-resistance., , , and . Microelectronics Reliability, (2018)