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Disambiguation of "Beek, Simon Van"

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Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown.

, , , , , , , , , , and . IRPS, page 5-1. IEEE, (2018)

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Hon. -Prof. Dr. -Ing. Volker Simon University of Stuttgart

Univ. -Prof. Dr. -Ing. Sven Simon University of Stuttgart

Adina Lucia Simonovic University of Stuttgart

Kai Simon University of Stuttgart

Sara Simonovska University of Stuttgart

 

Other publications of authors with the same name

Experimental extraction of BEOL composite equivalent thermal conductivities for application in self-heating simulations., , , and . ESSDERC, page 186-189. IEEE, (2018)Array-Based Statistical Characterization of CMOS Degradation Modes and Modeling of the Time-Dependent Variability Induced by Different Stress Patterns in the VG, VD bias space., , , , , , and . IRPS, page 1-6. IEEE, (2019)Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fit., , , , , , and . ESSDERC, page 146-149. IEEE, (2018)SOT-MRAM 300mm integration for low power and ultrafast embedded memories., , , , , , , , , and 9 other author(s). CoRR, (2018)Four point probe ramped voltage stress as an efficient method to understand breakdown of STT-MRAM MgO tunnel junctions., , , , , , , , and . IRPS, page 4. IEEE, (2015)SOT-MRAM 300MM Integration for Low Power and Ultrafast Embedded Memories., , , , , , , , , and 9 other author(s). VLSI Circuits, page 81-82. IEEE, (2018)Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown., , , , , , , , , and 1 other author(s). IRPS, page 5-1. IEEE, (2018)