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%0 Conference Paper
%1 conf/essderc/BeekRODCLK18
%A Beek, Simon Van
%A Roussel, Philippe
%A O'Sullivan, Barry J.
%A Degraeve, Robin
%A Cosemans, Stefan
%A Linten, Dimitri
%A Kar, Gouri Sankar
%B ESSDERC
%D 2018
%I IEEE
%K dblp
%P 146-149
%T Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fit.
%U http://dblp.uni-trier.de/db/conf/essderc/essderc2018.html#BeekRODCLK18
%@ 978-1-5386-5401-9
@inproceedings{conf/essderc/BeekRODCLK18,
added-at = {2018-12-18T00:00:00.000+0100},
author = {Beek, Simon Van and Roussel, Philippe and O'Sullivan, Barry J. and Degraeve, Robin and Cosemans, Stefan and Linten, Dimitri and Kar, Gouri Sankar},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2e3fe9e119b66f5995ce9414cd58caa0e/dblp},
booktitle = {ESSDERC},
crossref = {conf/essderc/2018},
ee = {https://doi.org/10.1109/ESSDERC.2018.8486879},
interhash = {55c52715ad2d46b8fb232d2a0b06f20e},
intrahash = {e3fe9e119b66f5995ce9414cd58caa0e},
isbn = {978-1-5386-5401-9},
keywords = {dblp},
pages = {146-149},
publisher = {IEEE},
timestamp = {2019-09-27T12:42:05.000+0200},
title = {Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fit.},
url = {http://dblp.uni-trier.de/db/conf/essderc/essderc2018.html#BeekRODCLK18},
year = 2018
}
