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Testing PUF-based secure key storage circuits.

M. Cortez, G. Roelofs, S. Hamdioui, and G. Natale. DATE, page 1-6. European Design and Automation Association, (2014)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Univ. -Prof. Dr. -Ing. Giorgio Cattaneo University of Stuttgart

Di Liu University of Stuttgart

Luca Di Grazia University of Stuttgart

Roberta Di Bari University of Stuttgart

Martin Diesch University of Stuttgart

Other publications of authors with the same name

March Test Generation Revealed.A. Benso, A. Bosio, S. Carlo, G. Natale, and P. Prinetto. IEEE Trans. Computers, 57 (12): 1704-1713 (2008)Laser-Induced Fault Simulation.F. Lu, G. Natale, M. Flottes, and B. Rouzeyre. DSD, page 609-614. IEEE Computer Society, (2013)Hardware Trojan prevention using layout-level design approach.P. Ba, P. Manikandan, S. Dupuis, M. Flottes, G. Natale, and B. Rouzeyre. ECCTD, page 1-4. IEEE, (2015)On-chip test comparison for protecting confidential data in secure ICs.J. DaRolt, G. Natale, M. Flottes, and B. Rouzeyre. European Test Symposium, page 1. IEEE Computer Society, (2012)Scan Attacks and Countermeasures in Presence of Scan Response Compactors.J. DaRolt, G. Natale, M. Flottes, and B. Rouzeyre. European Test Symposium, page 19-24. IEEE Computer Society, (2011)A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic.R. Bastos, G. Natale, M. Flottes, F. Lu, and B. Rouzeyre. J. Electronic Testing, 29 (3): 331-340 (2013)STT-MRAM-Based Strong PUF Architecture.E. Vatajelu, G. Natale, L. Torres, and P. Prinetto. ISVLSI, page 467-472. IEEE Computer Society, (2015)Security primitives (PUF and TRNG) with STT-MRAM.E. Vatajelu, G. Natale, and P. Prinetto. VTS, page 1-4. IEEE Computer Society, (2016)Faster-than-at-speed execution of functional programs: An experimental analysis.P. Bernardi, A. Bosio, G. Natale, A. Guerriero, and F. Venini. VLSI-SoC, page 1-6. IEEE, (2016)Frontside Versus Backside Laser Injection: A Comparative Study.S. Castro, J. Dutertre, B. Rouzeyre, G. Natale, and M. Flottes. JETC, 13 (1): 6:1-6:15 (2016)

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Disambiguation of "Natale, Giorgio Di"

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Testing PUF-based secure key storage circuits.

Please choose a person to relate this publication to

Univ. -Prof. Dr. -Ing. Giorgio Cattaneo University of Stuttgart

Di Liu University of Stuttgart

Luca Di Grazia University of Stuttgart

Roberta Di Bari University of Stuttgart

Martin Diesch University of Stuttgart

Other publications of authors with the same name

Disambiguation

PUMA

Disambiguation of "Natale, Giorgio Di"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Testing PUF-based secure key storage circuits.

Please choose a person to relate this publication to

Univ. -Prof. Dr. -Ing. Giorgio Cattaneo University of Stuttgart

Di Liu University of Stuttgart

Luca Di Grazia University of Stuttgart

Roberta Di Bari University of Stuttgart

Martin Diesch University of Stuttgart

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Testing PUF-based secure key storage circuits.