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A Self-Repairing Execution Unit for Microprogrammed Processors., , and . IEEE Micro, 21 (5): 16-22 (2001)Efficient multi-level fault simulation of HW/SW systems for structural faults., , , , , , , and . SCIENCE CHINA Information Sciences, 54 (9): 1784-1796 (2011)Hardware Test: Can We Learn from Software Testing?, , , , , , and . VTS, page 320-321. IEEE Computer Society, (1997)An Optimal Algorithm for the Automatic Generation of March Tests., , , and . DATE, page 938-943. IEEE Computer Society, (2002)STT MRAM-Based PUFs., , , and . DATE, page 872-875. ACM, (2015)Guest Editorial., and . J. Electronic Testing, 17 (3-4): 207 (2001)PART: Programmable Array Testing Based on a Partitioning Algorithm., , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 3 (2): 142-149 (1984)Design and optimization of adaptable BCH codecs for NAND flash memories., , , and . Microprocessors and Microsystems - Embedded Hardware Design, 37 (4-5): 407-419 (2013)Functional testing approaches for "BIFST-able" tlm_fifo., , , , and . HLDVT, page 85-92. IEEE Computer Society, (2008)An experimental analysis of the effectiveness of the circular self-test path technique., , and . EURO-DAC, page 246-251. IEEE Computer Society, (1994)