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Disambiguation of "Bastos, Rodrigo Possamai"

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A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic.

, , , , and . J. Electronic Testing, 29 (3): 331-340 (2013)

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Rodrigo Andler University of Stuttgart

Rodrigo Lopez Portillo Alcocer University of Stuttgart

 

Other publications of authors with the same name

A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic., , , , and . J. Electronic Testing, 29 (3): 331-340 (2013)Design at high level of a robust 8-bit microprocessor to soft errors by using only standard gates., , and . SBCCI, page 196-201. ACM, (2006)Importance of IR drops on the modeling of laser-induced transient faults., , , and . SMACD, page 1-4. IEEE, (2017)Non-intrusive testing technique for detection of Trojans in asynchronous circuits., , , and . DATE, page 1516-1519. IEEE, (2018)A Distributed Body-Biasing Strategy for Asynchronous Circuits., , , , , , , , and . VLSI-SoC, page 27-32. IEEE, (2019)Comparing transient-fault effects on synchronous and on asynchronous circuits., , , , , and . IOLTS, page 29-34. IEEE Computer Society, (2009)Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies., , , , and . Microelectronics Reliability, 50 (9-11): 1241-1246 (2010)Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode., , , , and . Microelectronics Reliability, 52 (9-10): 1781-1786 (2012)Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS., , , , , , and . Microelectronics Reliability, 54 (9-10): 2289-2294 (2014)Design of a soft-error robust microprocessor., , and . Microelectronics Journal, 40 (7): 1062-1068 (2009)