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On-chip test comparison for protecting confidential data in secure ICs.

, , , and . European Test Symposium, page 1. IEEE Computer Society, (2012)

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Test Versus Security: Past and Present., , , , , and . IEEE Trans. Emerging Topics Comput., 2 (1): 50-62 (2014)Are advanced DfT structures sufficient for preventing scan-attacks?, , , and . VTS, page 246-251. IEEE Computer Society, (2012)A smart test controller for scan chains in secure circuits., , , and . IOLTS, page 228-229. IEEE, (2013)Scan attacks on side-channel and fault attack resistant public-key implementations., , , , , , and . J. Cryptographic Engineering, 2 (4): 207-219 (2012)On-chip test comparison for protecting confidential data in secure ICs., , , and . European Test Symposium, page 1. IEEE Computer Society, (2012)Scan Attacks and Countermeasures in Presence of Scan Response Compactors., , , and . European Test Symposium, page 19-24. IEEE Computer Society, (2011)New security threats against chips containing scan chain structures., , , and . HOST, page 110. IEEE Computer Society, (2011)Secure JTAG Implementation Using Schnorr Protocol., , , , , , , , and . J. Electronic Testing, 29 (2): 193-209 (2013)A novel differential scan attack on advanced DFT structures., , , and . ACM Trans. Design Autom. Electr. Syst., 18 (4): 58:1-58:22 (2013)A New Scan Attack on RSA in Presence of Industrial Countermeasures., , , , , and . COSADE, volume 7275 of Lecture Notes in Computer Science, page 89-104. Springer, (2012)