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Disambiguation of "Natale, Giorgio Di"

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Cross-layer reliability evaluation, moving from the hardware architecture to the system level: A CLERECO EU project overview.

, , , , , , , , , , and . Microprocessors and Microsystems - Embedded Hardware Design, 39 (8): 1204-1214 (2015)

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Univ. -Prof. Dr. -Ing. Giorgio Cattaneo University of Stuttgart

Di Liu University of Stuttgart

Luca Di Grazia University of Stuttgart

Roberta Di Bari University of Stuttgart

Martin Diesch University of Stuttgart

 

Other publications of authors with the same name

Hardware Trojan prevention using layout-level design approach., , , , , and . ECCTD, page 1-4. IEEE, (2015)Laser-Induced Fault Simulation., , , and . DSD, page 609-614. IEEE Computer Society, (2013)On-chip test comparison for protecting confidential data in secure ICs., , , and . European Test Symposium, page 1. IEEE Computer Society, (2012)Scan Attacks and Countermeasures in Presence of Scan Response Compactors., , , and . European Test Symposium, page 19-24. IEEE Computer Society, (2011)March Test Generation Revealed., , , , and . IEEE Trans. Computers, 57 (12): 1704-1713 (2008)A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic., , , , and . J. Electronic Testing, 29 (3): 331-340 (2013)Cross-layer reliability evaluation, moving from the hardware architecture to the system level: A CLERECO EU project overview., , , , , , , , , and 1 other author(s). Microprocessors and Microsystems - Embedded Hardware Design, 39 (8): 1204-1214 (2015)Frontside Versus Backside Laser Injection: A Comparative Study., , , , and . JETC, 13 (1): 6:1-6:15 (2016)SECCS: SECure Context Saving for IoT Devices., , , , , and . CoRR, (2019)Security primitives (PUF and TRNG) with STT-MRAM., , and . VTS, page 1-4. IEEE Computer Society, (2016)