Author of the publication

Cross-layer reliability evaluation, moving from the hardware architecture to the system level: A CLERECO EU project overview.

, , , , , , , , , , and . Microprocessors and Microsystems - Embedded Hardware Design, 39 (8): 1204-1214 (2015)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

No persons found for author name Vallero, Alessandro
add a person with the name Vallero, Alessandro
 

Other publications of authors with the same name

Cross-layer reliability evaluation, moving from the hardware architecture to the system level: A CLERECO EU project overview., , , , , , , , , and 1 other author(s). Microprocessors and Microsystems - Embedded Hardware Design, 39 (8): 1204-1214 (2015)A Bayesian model for system level reliability estimation., , , , , , , and . ETS, page 1-2. IEEE, (2015)Microarchitecture level reliability comparison of modern GPU designs: First findings., , , and . ISPASS, page 129-130. IEEE Computer Society, (2017)Cross-layer early reliability evaluation: Challenges and promises., , , , , , , , , and 3 other author(s). IOLTS, page 228-233. IEEE, (2014)SyRA: Early System Reliability Analysis for Cross-Layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems., , , , , , , , , and 4 other author(s). IEEE Trans. Computers, 68 (5): 765-783 (2019)Bayesian network early reliability evaluation analysis for both permanent and transient faults., , , , , , , and . IOLTS, page 7-12. IEEE, (2015)A novel methodology to increase fault tolerance in autonomous FPGA-based systems., , , , , and . IOLTS, page 87-92. IEEE, (2014)Resistance impact by long connections on electrical behavior of integrated Memristive Biosensors., , , , and . ISCAS, page 385-388. IEEE, (2016)Memristive Biosensors Integration With Microfluidic Platform., , , , , , and . IEEE Trans. on Circuits and Systems, 63-I (12): 2120-2127 (2016)ReDO: Cross-Layer Multi-Objective Design-Exploration Framework for Efficient Soft Error Resilient Systems., , and . IEEE Trans. Computers, 67 (10): 1462-1477 (2018)