T. Haist, U. Schmid, and W. Osten. VDI Berichte, (1981)3 cites: https://scholar.google.com/scholar?cites=6001163947811595426&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Schönleber, and H. Tiziani. Applied optics, (1998)3 cites: https://scholar.google.com/scholar?cites=13523355979693248351&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Schönleber, and H. Tiziani. Optics Communications, (1997)113 cites: https://scholar.google.com/scholar?cites=2868264901183821891&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. Optical Inspection and …, (1997)3 cites: https://scholar.google.com/scholar?cites=4086429519103832408&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. Optics communications, (1999)6 cites: https://scholar.google.com/scholar?cites=7686503495750243020&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. tm Technisches Messen Plattform für Methoden …, (2002)2 cites: https://scholar.google.com/scholar?cites=17178941677927862963&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. Optics communications, (1998)36 cites: https://scholar.google.com/scholar?cites=5441514535776584317&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. TECHNISCHES MESSEN, (2002)1 cites: https://scholar.google.com/scholar?cites=13362241692780377838&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, E. Wagemann, and .... Laser Metrology and …, (1999)9 cites: https://scholar.google.com/scholar?cites=3277523645490623696&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, E. Wagemann, and H. Tiziani. Journal of Optics A: Pure …, (1999)15 cites: https://scholar.google.com/scholar?cites=8162882387938461535&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, S. Zwick, M. Warber, and .... Journal of Holography and …, (2006)21 cites: https://scholar.google.com/scholar?cites=3412191072089378493&as_sdt=2005&sciodt=0,5&hl=en.
M. Hasler, T. Haist, and W. Osten. Optics letters, (2012)22 cites: https://scholar.google.com/scholar?cites=4553495401397891673&as_sdt=2005&sciodt=0,5&hl=en.
M. Hasler, J. Stahl, T. Haist, and W. Osten. Optical Engineering, (2015)4 cites: https://scholar.google.com/scholar?cites=2954937903817151273&as_sdt=2005&sciodt=0,5&hl=en.
L. Hänel, Y. Elogail, D. Schwarz, I. Fischer, and J. Schulze. 2018 41st International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO), page 0027-0031. (May 2018)