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OTERA: Online Test Strategies for Reliable Reconfigurable Architectures

L. Bauer, C. Braun, M. Imhof, M. Kochte, H. Zhang, H. Wunderlich, and J. Henkel. Proceedings of the NASA/ESA Conference on Adaptive Hardware and Systems (AHS'12), page 38--45. IEEE Computer Society, (2012)
DOI: http://dx.doi.org/10.1109/AHS.2012.6268667

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Prof. Dr. Hans-Joachim Wunderlich University of Stuttgart

Hans-Joachim Bungartz

Hans-Joachim Bieg

Hans-Joachim Gehrmann University of Stuttgart

Univ. -Prof. Hans-Joachim Petsch University of Stuttgart

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Soft error correction in embedded storage elements.M. Imhof, and H. Wunderlich. IOLTS, page 169-174. IEEE Computer Society, (2011)Area-efficient synthesis of fault-secure NoC switches.A. Dalirsani, M. Kochte, and H. Wunderlich. IOLTS, page 13-18. IEEE, (2014)Probabilistische Verfahren für den Test hochintegrierter SchaltungenH. Wunderlich. Informatik-Fachberichte Springer, (1987)High Defect Coverage with Low-Power Test Sequences in a BIST Environment.P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel, and H. Wunderlich. IEEE Design & Test of Computers, 19 (5): 44-52 (2002)ETS 2015 best paper.H. Wunderlich, and P. Maxwell. ETS, page 1. IEEE, (2016)A Mixed-Mode BIST Scheme Based on Folding Compression.H. Liang, S. Hellebrand, and H. Wunderlich. J. Comput. Sci. Technol., 17 (2): 203-212 (2002)Deterministic logic BIST for transition fault testing.V. Gherman, H. Wunderlich, J. Schlöffel, and M. Garbers. IET Computers & Digital Techniques, 1 (3): 180-186 (2007)SAT-based ATPG beyond stuck-at fault testing.S. Hellebrand, and H. Wunderlich. it - Information Technology, 56 (4): 165-172 (2014)DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme (DFG-Project - Test and Reliability of Nano-Electronic Systems).B. Becker, I. Polian, S. Hellebrand, B. Straube, and H. Wunderlich. it - Information Technology, 48 (5): 304- (2006)A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction.S. Hellebrand, C. Zoellin, H. Wunderlich, S. Ludwig, T. Coym, and B. Straube. DFT, page 50-58. IEEE Computer Society, (2007)