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Disambiguation of "Zoellin, Christian G."

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A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction.

, , , , , and . DFT, page 50-58. IEEE Computer Society, (2007)

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G. Daiß

G. Wagner

Christian León University of Stuttgart

Dr. Guido Reina University of Stuttgart

Christian Hölzl University of Stuttgart

 

Other publications of authors with the same name

Efficient multi-level fault simulation of HW/SW systems for structural faults., , , , , , , and . SCIENCE CHINA Information Sciences, 54 (9): 1784-1796 (2011)Enabling pervasive encryption through IBM Z stack innovations., , , , , , , , , and 6 other author(s). IBM Journal of Research and Development, 62 (2/3): 2 (2018)Test exploration and validation using transaction level models., , , , , , , and . DATE, page 1250-1253. IEEE, (2009)Programmable deterministic Built-In Self-Test., , , , , , and . ITC, page 1-9. IEEE Computer Society, (2007)Efficient fault simulation on many-core processors., , , and . DAC, page 380-385. ACM, (2010)A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction., , , , , and . DFT, page 50-58. IEEE Computer Society, (2007)Blue Gene/L compute chip: Synthesis, timing, and physical design., , , , , , , , , and 2 other author(s). IBM Journal of Research and Development, 49 (2-3): 277-288 (2005)Concurrent Self-Test with Partially Specified Patterns for Low Test Latency and Overhead., , and . European Test Symposium, page 53-58. IEEE Computer Society, (2009)System reliability evaluation using concurrent multi-level simulation of structural faults., , , , , , , and . ITC, page 817. IEEE Computer Society, (2010)Efficient Concurrent Self-Test with Partially Specified Patterns., , and . J. Electronic Testing, 26 (5): 581-594 (2010)