PUMA

academical publication management
collect, organize, and share publications

( en | de )

 

Disambiguation of "Becker, Bernd"

Author of the publication

copydeleteadd this publication to your clipboard
DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme (DFG-Project - Test and Reliability of Nano-Electronic Systems).

, , , , and . it - Information Technology, 48 (5): 304- (2006)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Franziska Becker University of Stuttgart

Bernd Bertsche

Dr. -Ing. Dina Becker University of Stuttgart

Univ. -Prof. Dr. -Ing. Steffen Becker University of Stuttgart

Dr. rer. nat. Bernd Schulz University of Stuttgart

 

Other publications of authors with the same name

Parallel SAT Solving in Bounded Model Checking., , , , and . J. Log. Comput., 21 (1): 5-21 (2011)Layouts with Wires of Balanced Length, and . Inf. Comput., 73 (1): 45-59 (April 1987)Variation-aware fault modeling., , , , , , and . SCIENCE CHINA Information Sciences, 54 (9): 1813-1826 (2011)Binary Decision Diagrams - Theory and Implementation., and . Springer, (1998)Automatic Test Pattern Generation for Resistive Bridging Faults., , , and . J. Electronic Testing, 22 (1): 61-69 (2006)Parallel QBF Solving with Advanced Knowledge Sharing., , , , , and . Fundam. Inform., 107 (2-3): 139-166 (2011)Fault Models and Test Algorithms for Nanoscale Technologies (Fehlermodelle und Testalgorithmen für Nanoscale-Technologien)., and . it - Information Technology, 52 (4): 189-194 (2010)On the representational power of bit-level and word-level decision diagrams., , and . ASP-DAC, page 461-467. IEEE, (1997)Evolutionary Optimization of Markov Sources for Pseudo Random Scan BIST., , and . DATE, page 11184-11185. IEEE Computer Society, (2003)On the automatic generation of SBST test programs for in-field test., , , , and . DATE, page 1186-1191. ACM, (2015)