Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Analysis of the XC6000 Architecture for Embedded System Design., , , and . FCCM, page 245-252. IEEE Computer Society, (1998)Verification by Simulation Comparison using Interface Synthesis., , and . DATE, page 436-443. IEEE Computer Society, (1998)Test pattern generation hardware motivated by pseudo-exhaustive test techniques.. EURO-DAC, page 240-245. IEEE Computer Society, (1994)Produktionstest synchroner Schaltwerke auf der Basis von Pipelinestrukturen.. GI Jahrestagung (2), volume 188 of Informatik-Fachberichte, page 92-105. Springer, (1988)Self-test of sequential circuits with deterministic test pattern sequences., and . J. Electronic Testing, 5 (2-3): 307-312 (1994)Enhanced functionality by coupling the JESSI-COMMON-Framework with an ECAD framework., and . ED&TC, page 285-293. IEEE Computer Society, (1995)Reduced design time by load distribution with CAD framework methodology information., , and . EURO-DAC, page 314-319. IEEE Computer Society, (1995)Gate-Delay Fault Test with Conventional Scan-Design., and . EDAC-ETC-EUROASIC, page 524-528. IEEE Computer Society, (1994)Generation of deterministic test patterns by minimal basic test sets.. EURO-DAC, page 312-317. IEEE Computer Society Press, (1992)An analytical approach to the partial scan problem., and . J. Electronic Testing, 1 (2): 163-174 (1990)