%0 Journal Article %1 journals/et/KunzmannB94 %A Kunzmann, Arno %A Böhland, Frank %D 1994 %J J. Electronic Testing %K dblp %N 2-3 %P 307-312 %T Self-test of sequential circuits with deterministic test pattern sequences. %U http://dblp.uni-trier.de/db/journals/et/et5.html#KunzmannB94 %V 5

@article{journals/et/KunzmannB94, added-at = {2009-03-24T00:00:00.000+0100}, author = {Kunzmann, Arno and Böhland, Frank}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2a92fa6955038321e3ceb72a960143090/dblp}, ee = {http://dx.doi.org/10.1007/BF00972090}, interhash = {e15270b0e9d9b44be947ff3f4225f5e3}, intrahash = {a92fa6955038321e3ceb72a960143090}, journal = {J. Electronic Testing}, keywords = {dblp}, number = {2-3}, pages = {307-312}, timestamp = {2016-02-02T10:07:23.000+0100}, title = {Self-test of sequential circuits with deterministic test pattern sequences.}, url = {http://dblp.uni-trier.de/db/journals/et/et5.html#KunzmannB94}, volume = 5, year = 1994 }