%0 Conference Paper %1 conf/eurodac/Kunzmann94 %A Kunzmann, Arno %B EURO-DAC %D 1994 %E Mermet, Jean %I IEEE Computer Society %K dblp %P 240-245 %T Test pattern generation hardware motivated by pseudo-exhaustive test techniques. %U http://dblp.uni-trier.de/db/conf/eurodac/euro-dac1994.html#Kunzmann94 %@ 0-89791-685-9

@inproceedings{conf/eurodac/Kunzmann94, added-at = {2015-11-11T00:00:00.000+0100}, author = {Kunzmann, Arno}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2b3e32da8f4d0f826167890fe0e61e1c5/dblp}, booktitle = {EURO-DAC}, crossref = {conf/eurodac/1994}, editor = {Mermet, Jean}, ee = {http://dl.acm.org/citation.cfm?id=198252}, interhash = {1eec3af21ad5a3b62546a74092fd8899}, intrahash = {b3e32da8f4d0f826167890fe0e61e1c5}, isbn = {0-89791-685-9}, keywords = {dblp}, pages = {240-245}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T14:57:10.000+0100}, title = {Test pattern generation hardware motivated by pseudo-exhaustive test techniques.}, url = {http://dblp.uni-trier.de/db/conf/eurodac/euro-dac1994.html#Kunzmann94}, year = 1994 }