%0 Journal Article %1 journals/et/KieferW00 %A Kiefer, Gundolf %A Wunderlich, Hans-Joachim %D 2000 %J J. Electronic Testing %K dblp %N 3 %P 169-177 %T Deterministic BIST with Partial Scan. %U http://dblp.uni-trier.de/db/journals/et/et16.html#KieferW00 %V 16

@article{journals/et/KieferW00, added-at = {2009-03-22T00:00:00.000+0100}, author = {Kiefer, Gundolf and Wunderlich, Hans-Joachim}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2c1bd422321b1fc3ea06c43369e9514d5/dblp}, ee = {http://dx.doi.org/10.1023/A:1008374811502}, interhash = {a8d1ac24e67d796a791187a9d63d0733}, intrahash = {c1bd422321b1fc3ea06c43369e9514d5}, journal = {J. Electronic Testing}, keywords = {dblp}, number = 3, pages = {169-177}, timestamp = {2016-02-02T10:07:17.000+0100}, title = {Deterministic BIST with Partial Scan.}, url = {http://dblp.uni-trier.de/db/journals/et/et16.html#KieferW00}, volume = 16, year = 2000 }