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Disambiguation of "Wunderlich, Hans-Joachim"

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X-Masking During Logic BIST and Its Impact on Defect Coverage.

, , , , , , , and . ITC, page 442-451. IEEE Computer Society, (2004)

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Prof. Dr. Hans-Joachim Wunderlich University of Stuttgart

Hans-Joachim Bungartz

Hans-Joachim Bieg

Hans-Joachim Gehrmann University of Stuttgart

Univ. -Prof. Hans-Joachim Petsch University of Stuttgart

 

Other publications of authors with the same name

A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction., , , , , and . DFT, page 50-58. IEEE Computer Society, (2007)DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme (DFG-Project - Test and Reliability of Nano-Electronic Systems)., , , , and . it - Information Technology, 48 (5): 304- (2006)SAT-based ATPG beyond stuck-at fault testing., and . it - Information Technology, 56 (4): 165-172 (2014)Deterministic BIST with Partial Scan., and . J. Electronic Testing, 16 (3): 169-177 (2000)An analytical approach to the partial scan problem., and . J. Electronic Testing, 1 (2): 163-174 (1990)Adaptive Bayesian Diagnosis of Intermittent Faults., , , , and . J. Electronic Testing, 30 (5): 527-540 (2014)Deterministic Pattern Generation for Weighted Random Pattern Testing., and . ED&TC, page 30-36. IEEE Computer Society, (1996)Using mission logic for embedded testing., and . DATE, page 805. IEEE Computer Society, (2001)Reuse of Structural Volume Test Methods for In-System Testing of Automotive ASICs., , , , , and . Asian Test Symposium, page 214-219. IEEE Computer Society, (2012)Embedded Test for Highly Accurate Defect Localization., , , and . Asian Test Symposium, page 213-218. IEEE Computer Society, (2011)