Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Conference Paper
%1 conf/itc/TangWVHWEPB04
%A Tang, Yuyi
%A Wunderlich, Hans-Joachim
%A Vranken, Harald P. E.
%A Hapke, Friedrich
%A Wittke, Michael
%A Engelke, Piet
%A Polian, Ilia
%A Becker, Bernd
%B ITC
%D 2004
%I IEEE Computer Society
%K dblp
%P 442-451
%T X-Masking During Logic BIST and Its Impact on Defect Coverage.
%U http://dblp.uni-trier.de/db/conf/itc/itc2004.html#TangWVHWEPB04
%@ 0-7803-8581-0
@inproceedings{conf/itc/TangWVHWEPB04,
added-at = {2006-09-21T00:00:00.000+0200},
author = {Tang, Yuyi and Wunderlich, Hans-Joachim and Vranken, Harald P. E. and Hapke, Friedrich and Wittke, Michael and Engelke, Piet and Polian, Ilia and Becker, Bernd},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/27238c9ba31e043c0e507270165cd8687/dblp},
booktitle = {ITC},
crossref = {conf/itc/2004},
ee = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.207},
interhash = {91420cbab969059d99210776eb49f4a4},
intrahash = {7238c9ba31e043c0e507270165cd8687},
isbn = {0-7803-8581-0},
keywords = {dblp},
pages = {442-451},
publisher = {IEEE Computer Society},
timestamp = {2016-02-02T15:32:30.000+0100},
title = {X-Masking During Logic BIST and Its Impact on Defect Coverage.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc2004.html#TangWVHWEPB04},
year = 2004
}
