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Reuse of Structural Volume Test Methods for In-System Testing of Automotive ASICs.

A. Cook, D. Ull, M. Elm, H. Wunderlich, H. Randoll, and S. Dohren. Asian Test Symposium, page 214-219. IEEE Computer Society, (2012)

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Melanie Lipp University of Stuttgart

DuMux 3.3.0K. Weishaupt, H. Claß, E. Coltman, S. Emmert, B. Flemisch, D. Gläser, C. Grüninger, K. Heck, T. Jupe, M. Kelm and 11 other author(s). Software, (2020)

DuMux 3.3.0K. Weishaupt, H. Claß, E. Coltman, S. Emmert, B. Flemisch, D. Gläser, C. Grüninger, K. Heck, T. Jupe, M. Kelm and 11 other author(s). Software, (2020)DuMux 3.5.0Y. Wang, S. Ackermann, I. Buntic, H. Claß, E. Coltman, S. Emmert, B. Flemisch, D. Gläser, C. Grüninger, K. Heck and 16 other author(s). Software, (2022)DuMux 3.4.0H. Wu, B. Becker, S. Burbulla, E. Coltman, S. Emmert, B. Flemisch, D. Gläser, C. Grüninger, K. Heck, J. Hommel and 18 other author(s). Software, (2021)

Bassam Elmakhzangy University of Stuttgart

Omid Elmi University of Stuttgart

Melanie Streichert University of Stuttgart

Melanie Weber University of Stuttgart

Other publications of authors with the same name

Scan Chain Organization for Embedded Diagnosis.M. Elm, and H. Wunderlich. DATE, page 468-473. ACM, (2008)Reuse of Structural Volume Test Methods for In-System Testing of Automotive ASICs.A. Cook, D. Ull, M. Elm, H. Wunderlich, H. Randoll, and S. Dohren. Asian Test Symposium, page 214-219. IEEE Computer Society, (2012)Accurate X-Propagation for Test Applications by SAT-Based Reasoning.M. Kochte, M. Elm, and H. Wunderlich. IEEE Trans. on CAD of Integrated Circuits and Systems, 31 (12): 1908-1919 (2012)Test Encoding for Extreme Response Compaction.M. Kochte, S. Holst, M. Elm, and H. Wunderlich. European Test Symposium, page 155-160. IEEE Computer Society, (2009)Structural In-Field Diagnosis for Random Logic Circuits.A. Cook, M. Elm, H. Wunderlich, and U. Abelein. European Test Symposium, page 111-116. IEEE Computer Society, (2011)Structural Test for Graceful Degradation of NoC Switches.A. Dalirsani, S. Holst, M. Elm, and H. Wunderlich. European Test Symposium, page 183-188. IEEE Computer Society, (2011)On Determining the Real Output Xs by SAT-Based Reasoning.M. Elm, M. Kochte, and H. Wunderlich. Asian Test Symposium, page 39-44. IEEE Computer Society, (2010)BISD: Scan-based Built-In self-diagnosis.M. Elm, and H. Wunderlich. DATE, page 1243-1248. IEEE, (2010)Structural Test and Diagnosis for Graceful Degradation of NoC Switches.A. Dalirsani, S. Holst, M. Elm, and H. Wunderlich. J. Electronic Testing, 28 (6): 831-841 (2012)Scan chain clustering for test power reduction.M. Elm, H. Wunderlich, M. Imhof, C. Zoellin, J. Leenstra, and N. Mäding. DAC, page 828-833. ACM, (2008)

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Disambiguation of "Elm, Melanie"

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Reuse of Structural Volume Test Methods for In-System Testing of Automotive ASICs.

Please choose a person to relate this publication to

Melanie Lipp University of Stuttgart

Bassam Elmakhzangy University of Stuttgart

Omid Elmi University of Stuttgart

Melanie Streichert University of Stuttgart

Melanie Weber University of Stuttgart

Other publications of authors with the same name

Disambiguation

PUMA

Disambiguation of "Elm, Melanie"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Reuse of Structural Volume Test Methods for In-System Testing of Automotive ASICs.

Please choose a person to relate this publication to

Melanie Lipp University of Stuttgart

Bassam Elmakhzangy University of Stuttgart

Omid Elmi University of Stuttgart

Melanie Streichert University of Stuttgart

Melanie Weber University of Stuttgart

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Reuse of Structural Volume Test Methods for In-System Testing of Automotive ASICs.