%0 Journal Article %1 journals/et/DalirsaniHEW12 %A Dalirsani, Atefe %A Holst, Stefan %A Elm, Melanie %A Wunderlich, Hans-Joachim %D 2012 %J J. Electronic Testing %K dblp %N 6 %P 831-841 %T Structural Test and Diagnosis for Graceful Degradation of NoC Switches. %U http://dblp.uni-trier.de/db/journals/et/et28.html#DalirsaniHEW12 %V 28

@article{journals/et/DalirsaniHEW12, added-at = {2012-12-10T00:00:00.000+0100}, author = {Dalirsani, Atefe and Holst, Stefan and Elm, Melanie and Wunderlich, Hans-Joachim}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/27ace034b3e1b191bdd41d44406b7b173/dblp}, ee = {http://dx.doi.org/10.1007/s10836-012-5329-9}, interhash = {6c1b8242fcc7d563b9f69f3e5b25a882}, intrahash = {7ace034b3e1b191bdd41d44406b7b173}, journal = {J. Electronic Testing}, keywords = {dblp}, number = 6, pages = {831-841}, timestamp = {2016-02-02T10:07:31.000+0100}, title = {Structural Test and Diagnosis for Graceful Degradation of NoC Switches.}, url = {http://dblp.uni-trier.de/db/journals/et/et28.html#DalirsaniHEW12}, volume = 28, year = 2012 }