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A Behavioral Model of MEMS Convective Accelerometers for the Evaluation of Design and Calibration Strategies at System Level.

, , , , and . J. Electronic Testing, 27 (3): 411-423 (2011)

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Combining Functional and Structural Approaches for Switched-Current Circuit Testing., , , and . J. Electronic Testing, 16 (3): 259-267 (2000)Implementation of a linear histogram BIST for ADCs., , , and . DATE, page 590-595. IEEE Computer Society, (2001)An electrical test method for MEMS convective accelerometers: Development and evaluation., , , , and . DATE, page 806-811. IEEE, (2011)Delay Testing of MOS Transistor with Gate Oxide Short., , , and . Asian Test Symposium, page 168-173. IEEE Computer Society, (2003)BISTing Switched-Current Circuits., , , and . Asian Test Symposium, page 372-377. IEEE Computer Society, (1998)A Successful Distance-Learning Experience for IC Test Education., , , and . MSE, page 20-21. IEEE Computer Society, (1999)An Approach to the Built-In Self-Test of Field Programmable Analog Arrays., , , , and . VTS, page 383-388. IEEE Computer Society, (2004)Design-For-Testability for Switched-Current Circuits., , , and . VTS, page 370-375. IEEE Computer Society, (1998)Testing the Configurable Analog Blocks of Field Programmable Analog Arrays., , , , and . ITC, page 893-902. IEEE Computer Society, (2004)Boolean and current detection of MOS transistor with gate oxide short., , , , and . ITC, page 1039-1048. IEEE Computer Society, (2001)