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Design-For-Testability for Switched-Current Circuits., , , and . VTS, page 370-375. IEEE Computer Society, (1998)Combining Functional and Structural Approaches for Switched-Current Circuit Testing., , , and . J. Electronic Testing, 16 (3): 259-267 (2000)BISTing Switched-Current Circuits., , , and . Asian Test Symposium, page 372-377. IEEE Computer Society, (1998)