%0 Conference Paper %1 conf/ats/RenovellGAB03 %A Renovell, Michel %A Gallière, Jean Marc %A Azaïs, Florence %A Bertrand, Yves %B Asian Test Symposium %D 2003 %I IEEE Computer Society %K dblp %P 168-173 %T Delay Testing of MOS Transistor with Gate Oxide Short. %U http://dblp.uni-trier.de/db/conf/ats/ats2003.html#RenovellGAB03 %@ 0-7695-1951-2

@inproceedings{conf/ats/RenovellGAB03, added-at = {2016-01-13T00:00:00.000+0100}, author = {Renovell, Michel and Gallière, Jean Marc and Azaïs, Florence and Bertrand, Yves}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2a0a37043460828e6dbbe9beaa33c57aa/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2003}, ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250804}, interhash = {b9f0eeed8b44e06f04f4ca15c50b3fd1}, intrahash = {a0a37043460828e6dbbe9beaa33c57aa}, isbn = {0-7695-1951-2}, keywords = {dblp}, pages = {168-173}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T14:23:10.000+0100}, title = {Delay Testing of MOS Transistor with Gate Oxide Short.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2003.html#RenovellGAB03}, year = 2003 }