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Disambiguation of "Renovell, Michel"

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Boolean and current detection of MOS transistor with gate oxide short.

, , , , and . ITC, page 1039-1048. IEEE Computer Society, (2001)

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Johannes Michel University of Stuttgart

Michel Choudalakis University of Stuttgart

Michel Mom University of Stuttgart

 

Other publications of authors with the same name

Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC., , , , , and . IET Computers & Digital Techniques, 1 (3): 146-153 (2007)Optimal conditions for Boolean and current detection of floating gate faults., , , , and . ITC, page 477-486. IEEE Computer Society, (1999)Different experiments in test generation for XILINX FPGAs., and . ITC, page 854-862. IEEE Computer Society, (2000)Änalogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC., , , , , and . European Test Symposium, page 159-164. IEEE Computer Society, (2006)Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing., , , , , and . LATW, page 1-6. IEEE, (2014)On the detectability of CMOS floating gate transistor faults., , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 20 (1): 116-128 (2001)Simulating Resistive-Bridging and Stuck-At Faults., , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 25 (10): 2181-2192 (2006)A Framework for Efficient Implementation of Analog/RF Alternate Test with Model Redundancy., , , , , and . ISVLSI, page 621-626. IEEE Computer Society, (2015)Testing for gate oxide short defects using the detectability interval paradigm., , , and . it - Information Technology, 56 (4): 173-181 (2014)Guest Editorial., , and . J. Electronic Testing, 21 (3): 203 (2005)