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Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC.

, , , , , and . IET Computers & Digital Techniques, 1 (3): 146-153 (2007)

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Änalogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC., , , , , and . European Test Symposium, page 211-216. IEEE Computer Society, (2007)Digital Test Method for Embedded Converters with Unknown-Phase Harmonics., , , , , and . J. Electronic Testing, 27 (3): 335-350 (2011)A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs., , , , , and . IEEE Design & Test of Computers, 23 (3): 234-243 (2006)Making predictive analog/RF alternate test strategy independent of training set size., , , , , , and . ITC, page 1-9. IEEE Computer Society, (2012)Fast Digital Post-Processing Technique for Integral Nonlinearity Correction of Analog-to-Digital Converters: Validation on a 12-Bit Folding-and-Interpolating Analog-to-Digital Converter., , , , and . IEEE Trans. Instrumentation and Measurement, 60 (3): 768-775 (2011)ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator., , , , , , and . VLSI Design, (2008)Predicting dynamic specifications of ADCs with a low-quality digital input signal., , and . European Test Symposium, page 158-163. IEEE Computer Society, (2010)A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC., , , , , , , and . Microelectronics Journal, 44 (9): 840-843 (2013)Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements., , , , , and . Microelectronics Journal, 45 (3): 336-344 (2014)Formal analysis of high-performance stabilized active-input current mirror., , , , and . ISCAS, page 1-4. IEEE, (2017)