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Advanced Diagnosis: SBST and BIST Integration in Automotive E/E Architectures.

F. Reimann, M. Glaß, J. Teich, A. Cook, L. Gómez, D. Ull, H. Wunderlich, P. Engelke, and U. Abelein. DAC, page 96:1-96:9. ACM, (2014)

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Patrick Pietrantuono University of Stuttgart

Other publications of authors with the same name

Simulating Resistive-Bridging and Stuck-At Faults.P. Engelke, I. Polian, M. Renovell, and B. Becker. IEEE Trans. on CAD of Integrated Circuits and Systems, 25 (10): 2181-2192 (2006)TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis.A. Czutro, I. Polian, M. Lewis, P. Engelke, S. Reddy, and B. Becker. VLSI Design, page 227-232. IEEE Computer Society, (2009)SUPERB: Simulator utilizing parallel evaluation of resistive bridges.P. Engelke, B. Becker, M. Renovell, J. Schlöffel, B. Braitling, and I. Polian. ACM Trans. Design Autom. Electr. Syst., 14 (4): 56:1-56:21 (2009)Resistive Bridge Fault Model Evolution from Conventional to Ultra Deep Submicron Technologies.I. Polian, S. Kundu, J. Gallière, P. Engelke, M. Renovell, and B. Becker. VTS, page 343-348. IEEE Computer Society, (2005)Automatic Test Pattern Generation for Interconnect Open Defects.S. Spinner, I. Polian, P. Engelke, B. Becker, M. Keim, and W. Cheng. VTS, page 181-186. IEEE Computer Society, (2008)Automatic test pattern generation for resistive bridging faults.P. Engelke, I. Polian, M. Renovell, and B. Becker. European Test Symposium, page 160-165. IEEE Computer Society, (2004)Automatic Test Pattern Generation for Resistive Bridging Faults.P. Engelke, I. Polian, M. Renovell, and B. Becker. J. Electronic Testing, 22 (1): 61-69 (2006)X-masking during logic BIST and its impact on defect coverage.Y. Tang, H. Wunderlich, P. Engelke, I. Polian, B. Becker, J. Schlöffel, F. Hapke, and M. Wittke. IEEE Trans. VLSI Syst., 14 (2): 193-202 (2006)Advanced Diagnosis: SBST and BIST Integration in Automotive E/E Architectures.F. Reimann, M. Glaß, J. Teich, A. Cook, L. Gómez, D. Ull, H. Wunderlich, P. Engelke, and U. Abelein. DAC, page 96:1-96:9. ACM, (2014)Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability Analysis.A. Czutro, I. Polian, M. Lewis, P. Engelke, S. Reddy, and B. Becker. International Journal of Parallel Programming, 38 (3-4): 185-202 (2010)

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Disambiguation of "Engelke, Piet"

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Advanced Diagnosis: SBST and BIST Integration in Automotive E/E Architectures.

Please choose a person to relate this publication to

Patrick Pietrantuono University of Stuttgart

Other publications of authors with the same name

Disambiguation

PUMA

Disambiguation of "Engelke, Piet"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Advanced Diagnosis: SBST and BIST Integration in Automotive E/E Architectures.

Please choose a person to relate this publication to

Patrick Pietrantuono University of Stuttgart

Other publications of authors with the same name

Disambiguation

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Advanced Diagnosis: SBST and BIST Integration in Automotive E/E Architectures.